Technical Resources


Technical resources include a new apparatus for in situ Surface Analysis, Imaging and Electrochemistry under Gas and Liquid Environments (see picture). It combines in the same system in situ XPS (X-ray Photoelectron Spectroscopy), in situ STM (Scanning Tunnelling Microscopy), and electrochemistry with direct transfer of samples in the closed system without exposure to air. This facility allows to apply surface analysis technique far beyond the usual level. XPS and STM can be combined for in situ measurements in gas, and STM for in situ measurements in liquid with simultaneous electrochemical measurements of the reaction kinetics, all integrated in one system. Cross analysis with sample transfer under inert gas in the closed system and to other closed systems without exposure of the sample to air can be performed. Other technical resources include a stand-alone platform for STM/AFM analysis in liquid environments under electrochemical control and ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) equipped with a direct transfer to an Ar-filled glove box.

Apparatus for integrated Surface Analysis, Imaging and Electrochemistry under Gas and Liquid Environments. This system is used to observe and characterise the modifications of material surfaces caused by their interactions with the environment.